@Article{HasarKayaBarrErtu:2015:DeReIn,
author = "Hasar, Ugur C. and Kaya, Yunus and Barroso de Castro, Joaquim
Jos{\'e} and Ertugrul, Mehmet",
affiliation = "{University of Gaziantep} and {Bayburt University} and {Instituto
Nacional de Pesquisas Espaciais (INPE)} and {Ataturk University}",
title = "Determination of reference-plane invariant, thickness-independent,
and broadband constitutive parameters of thin materials",
journal = "IEEE Transactions on Microwave Theory and Techniques",
year = "2015",
volume = "63",
number = "7",
pages = "2313--2321",
month = "July",
keywords = "Constitutive parameters, reference-plane invariant, thickness
independent, thin samples.",
abstract = "We propose an effective microwave method for
reference-plane-invariant and thickness-independent constitutive
parameters measurement of thin materials. A function depending
only on the interface reflection coefficient to facilitate fast
computations of constitutive parameters is derived. In addition to
the extraction of sample thickness, the method can also be applied
to unique retrieval of constitutive parameters whose
electromagnetic properties are yet unknown. We have performed an
uncertainty analysis to examine how the accuracy of the method can
be improved. Finally, we have compared the proposed method with
other similar methods in the literature using measurements of
distilled water and a thinner Plexiglas sample (1 mm). From the
comparison, we note that the accuracy of our proposed method is
not affected by any inaccurate knowledge of reference-plane
positions and the sample length (or both) while those of compared
methods are seriously decreased.",
doi = "10.1109/TMTT.2015.2431685",
url = "http://dx.doi.org/10.1109/TMTT.2015.2431685",
issn = "0018-9480",
language = "en",
urlaccessdate = "27 abr. 2024"
}